Eita Tochigi, Associate Professor

Deformation and fracture of crystalline materials are originated from mechanical response of lattice defect such as dislocations, twins and cracks. Transmission electron microscopy (TEM) is known to be one of superior techniques to directly observe the microstructures and atomic structures of lattice defects. In situ TEM mechanical testing provides information on microstructural evolution and mechanical responses during deformation and fracture behavior. Our research topics include: structural characterizations of lattice defects by TEM techniques, development of loading devices for in situ TEM mechanical testing based on MEMS technology, and applied in situ experimental works.